Thickness-dependent ferromagnetic metal to paramagnetic insulator transition in<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi mathvariant="normal">La</mml:mi><mml:mrow><mml:mn>0.6</mml:mn></mml:mrow></mml:msub></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi mathvariant="normal">Sr</mml:mi><mml:mrow><mml:mn>0.4</mml:mn></mml:mrow></mml:msub></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML"><mml:msub><mml:mi mathvariant="normal">MnO</mml:mi><mml:mn>3</mml:mn></mml:msub></mml:math>thin films studied by x-ray magnetic circular dichroism

Goro Shibata(The University of Tokyo), A. Fujimori(Japan Atomic Energy Agency), Akihito Sawa(National Institute of Advanced Industrial Science and Technology), Yukiharu Takeda(Japan Atomic Energy Agency), Hiroshi Kumigashira(High Energy Accelerator Research Organization), Enju Sakai(High Energy Accelerator Research Organization), Hiroshi Yamagami(Japan Atomic Energy Agency), Y. Saitoh(Japan Atomic Energy Agency), V. R. Singh(Central University of South Bihar), Takayuki Harano(The University of Tokyo), Takashi Kadono(The University of Tokyo), T. Koide(High Energy Accelerator Research Organization), K. Yoshimatsu(The University of Tokyo), M. Oshima(The University of Tokyo), T. Okane(Japan Atomic Energy Agency), Keisuke Ishigami(The University of Tokyo), V. K. Verma(The University of Tokyo)
Physical Review B
June 23, 2014
Cited by 31


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