Annealing effects of In2O3 thin films on electrical properties and application in thin film transistors
Zijian Yuan(Capital Normal University), Huizhen Wu(State Key Laboratory of Silicon Materials), Bingpo Zhang(State Key Laboratory of Silicon Materials), Xiong Wang(State Key Laboratory of Silicon Materials), Zhu Xiaming(State Key Laboratory of Silicon Materials), Xi-Kun Cai(State Key Laboratory of Silicon Materials)
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