Device linearity and intermodulation distortion comparison of dual material gate and conventional AlGaN/GaN high electron mobility transistor

Sona P. Kumar(University of Delhi), Mridula Gupta(University of Delhi), R.S. Gupta(University of Delhi), Rishu Chaujar(Delhi Technological University), Anju Agrawal(University of Delhi)
Microelectronics Reliability
October 30, 2010
Cited by 101


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