Hall-Effect Measurements Probing the Degree of Charge-Carrier Delocalization in Solution-Processed Crystalline Molecular Semiconductors
Jui-Fen Chang(University of Cambridge), Henning Sirringhaus(University of Cambridge), Yoann Olivier(University of Mons), Jérôme Cornil(University of Mons), Tomo Sakanoue(University of Cambridge), Takafumi Uemura(Osaka Research Institute of Industrial Science and Technology), Jun Takeya(National Institute for Materials Science), Alessandro Troisi(University of Warwick), Marie-Beatrice Dufourg-Madec(University of Manchester), Stephen G. Yeates(University of Manchester)
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