A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source
Tony Warwick(Lawrence Berkeley National Laboratory), Keith D. Franck(Lawrence Berkeley National Laboratory), J. B. Kortright(Lawrence Berkeley National Laboratory), G. Meigs(Lawrence Berkeley National Laboratory), Mario M. Moronne(Lawrence Berkeley National Laboratory), Satish C. B. Myneni(Lawrence Berkeley National Laboratory), Eli Rotenberg(Lawrence Berkeley National Laboratory), Sudipta Seal(Lawrence Berkeley National Laboratory), W. F. Steele(Lawrence Berkeley National Laboratory), Harald Ade(North Carolina State University), Adrian Garcia(North Carolina State University), S. Cerasari(University of Trieste), Jonathan D. Denlinger(University of Michigan), Shinjiro Hayakawa(The University of Tokyo), Adam P. Hitchcock(McMaster University), T. Tyliszczak(McMaster University), Jun Kikuma(Asahi Kasei (Germany)), E. G. Rightor(Dow Chemical (United States)), Hyun‐Joon Shin(Pohang University of Science and Technology), B. P. Tonner(University of Wisconsin–Milwaukee)
Cited by 105Open Access
Abstract
Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials.
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