Generalized four-point characterization method using capacitive and ohmic contacts

Brian S. Kim(Northwestern University), M. Grayson(Northwestern University), N. Işık(Schott (Germany)), Yash D. Shah(Northwestern University), Chuanle Zhou(Missouri University of Science and Technology), Wang Zhou(Northwestern University)
Review of Scientific Instruments
February 1, 2012
Cited by 5


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