High-resolution transmission electron microscopy study on strained epitaxial manganite thin films and heterostructures
B. Wiedenhorst(Infineon Technologies (Germany)), C. Höfener(University of Cologne), Bert Freitag, M. S. Ramachandra Rao(Indian Institute of Technology Madras), Lambert Alff(Technische Universität Darmstadt), Jacques‐Olivier Klein(University of Cologne), W. Mader(University of Bonn), Yafeng Lu(University of Cologne)
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