Evidence of hot electrons generated from an AlN∕GaN high electron mobility transistor
Suvranta K. Tripathy(University of Michigan–Dearborn), Jacob B. Khurgin(Johns Hopkins University), Guibao Xu(Lehigh University), Yujie J. Ding(Tianjin University of Traditional Chinese Medicine), Debdeep Jena(Cornell University), Yu Cao(University of Notre Dame), Xiaodong Mu, Kejia Wang(University of Notre Dame)
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