Establishing a scale of directional-hemispherical reflectance factor I: The Van den Akker method
William H. Venable(National Institute of Standards and Technology), Jack J. Hsia(National Institute of Standards and Technology), Victor R. Weidner(National Institute of Standards and Technology)
Cited by 45Open Access
Abstract
A thorough study and error analysis was made of the Van den Akker or "auxiliary sphere" method of determining a scale of directional-hemispherical reflectance factor. The effects of a non-Lambertian distribution of the reflected radiation, including retroreflection, were included in this study. Three working standards were measured to an uncertainty in reflectance of less than ±0.0015 and these will be used as a basis for a new, more accurate NBS scale of 6°-hemispherical reflectance factor. The new scale and the NBS scale established in 1965 are in agreement to within the uncertainty of ±0.005 assigned to the 1965 scale.
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