Transport properties of single-crystalline<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mi mathvariant="normal">Cu</mml:mi><mml:mi>x</mml:mi></mml:msub><mml:mi mathvariant="normal">Ti</mml:mi><mml:msub><mml:mi mathvariant="normal">Se</mml:mi><mml:mn>2</mml:mn></mml:msub></mml:mrow></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:mo>(</mml:mo><mml:mn>0.015</mml:mn><mml:mo>⩽</mml:mo><mml:mi>x</mml:mi><mml:mo>⩽</mml:mo><mml:mn>0.110</mml:mn><mml:mo>)</mml:mo></mml:mrow></mml:math>
Gang Wu(Agency for Science, Technology and Research), X. H. Chen(University of Science and Technology of China), Tao Wu(University of Science and Technology of China), X. G. Luo(University of Science and Technology of China), Guoyu Wang(Chongqing University), Li Zhao(University of Science and Technology of China), Hui Yang(Chinese Academy of Sciences)
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