Quantitative measurement of displacement and strain fields from HREM micrographs

Martin Hÿtch; E. Snoeck; R. Kilaas

doi:10.1016/s0304-3991(98)00035-7

Quantitative measurement of displacement and strain fields from HREM micrographs

Martin Hÿtch(Centre National de la Recherche Scientifique), E. Snoeck(Centre National de la Recherche Scientifique), R. Kilaas(University of California, Berkeley)

Ultramicroscopy

August 1, 1998

10.1016/s0304-3991(98)00035-7

Cited by 2,642

Abstract

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