<i>MOS Field-Effect Transistors and Integrated Circuits</i>
P. Richman, George Smith(Hull York Medical School)
Cited by 67
Related Papers
Charge Coupled Semiconductor Devices
|Bell System Technical Journal|1970|950
Effective<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>g</mml:mi></mml:math>Factor of Electrons and Holes in Bismuth
|Physical Review|1964|373
On the demystification of mental imagery
|Behavioral and Brain Sciences|1979|350
Factors affecting the patency of arteriovenous fistulas for dialysis access
|Journal of Vascular Surgery|2011|268
Thermoelectric Properties of Bismuth-Antimony Alloys
|Journal of Applied Physics|1962|258