Measurement of optical anisotropy in ultrathin films using surface plasmon resonance
V.P. Devanarayanan(Birla Institute of Technology and Science, Pilani), Jamil Akhtar(ICAR-National Bureau Of Plant Genetic Resources), Raj Kumar Gupta(Sardar Vallabhbhai Patel University of Agriculture & Technology), V. Manjuladevi, Sanjeev Kumar Gupta(Central Electronics Engineering Research Institute), Monika Poonia
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