Intrinsic Resitivity Nickel and Gold Thin Film Bolometers for Pulsed X-ray Measurements

J. McGurn(Sandia National Laboratories), Gerry Chandler, R. B. Spielman(Energetics (United States)), Peter Ryan(Sandia National Laboratories), C. Deeney(Energetics (United States)), D. L. Fehl(Sandia National Laboratories), J. L. McKenney(Sandia National Laboratories), C. A. Coverdale(Sandia National Laboratories)
Unknown
January 1, 1999
Cited by 0


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