The performance degradation of folded-cascode CMOS op-amp due to hot-carrier effects
Chong-Gun Yu(Incheon National University), Jong‐Tae Park(Flex (United States)), Hyunjoong Kim(National Institute of Ecology), Woon-Dal Jeong(Inha University)
Cited by 4
Related Papers
Multiple-gate SOI MOSFETs: device design guidelines
|IEEE Transactions on Electron Devices|2002|485
Evolution of recrystallization texture in nonoriented electrical steels
|Acta Materialia|2003|340
Pi-Gate SOI MOSFET
|IEEE Electron Device Letters|2001|257
FAM83H Mutations in Families with Autosomal-Dominant Hypocalcified Amelogenesis Imperfecta
|The American Journal of Human Genetics|2008|190
Nuclear Factor I-C Is Essential for Odontogenic Cell Proliferation and Odontoblast Differentiation during Tooth Root Development
|Journal of Biological Chemistry|2009|109