Resonance frequency analysis of implants subjected to immediate or early functional occlusal loading
Roland Glauser(University of Zurich), Christoph H. F. Hämmerle(University of Zurich), Jan Gottlow(University of Gothenburg), Neil Meredith(Leeds Dental Hospital), Lars Sennerby(Unknown), Andreas Rée(University of Zurich), AnnaKarin Lundgren(University of Gothenburg)
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