XFEL: The European X-Ray Free-Electron Laser - Technical Design Report

R. Abela; Arthur Aghababyan; M. Altarelli; C. Altucci; G. Amatuni; Philip Anfinrud; P. Audebert; V. Ayvazyan; N. Baboi; J. Baehr; V. Balandin; R. Bandelmann; Julian Becker; Bolko Beutner; C. Blome; I. Bohnet; Andy Bolzmann; Christoph Bostedt; Y. Bozhko; A. V. Brandt; S. Bratos; Christian Bressler; Ralf Brinkmann; Oleg Brovko; H. Brück; J.-P. Carneiro; S. Casalbuoni; M. Castellano; P. Castro; L. Catàni; A. Cavalleri; Serdar Çelik; Henry N. Chapman; D. Charalambidis; J. Chen; Majed Chergui; S. Choroba; A. Cianchi; M. Clausen; Éric Collet; H. Danared; C. David; Winfried Decking; M. Dehler; H. Delsim-Hashemi; G. Dipirro; B. R. Dobson; M. Dohlus; S. Duesterer; A. Eckhardt; H.-J. Eckoldt; H. Edwards; B. Faatz; M. Fajardo; Alexander Fateev; J. Feldhaus; Yu. F. Filipov; K. Floettmann; R. Follath; B. Fominykh; P. M. W. French; J. Frisch; L. Froehlich; E. Gadwinkel; L. García‐Tabarés; J.J. Gareta; T. Garvey; Faris Gel’mukhanov; U. Gensch; Ch. Gerth; M. Goerler; N. Golubeva; H. Graafsma; H.-J. Grabosch; W. Graeff; O. Grimm; B. Griogoryan; G. Grübel; Christian Gutt; Kirsten Hacker; L. Haenisch; U. Hahn; János Hajdu; J.H. Han; M. v. Hartrott; Jan Havlíček; O. Hensler; K. Honkavaara; V. Honkimäki; T. Hott; M.R. Howells; M. Huening; Hyotcherl Ihee; F.Ö. Ilday; R. Ischebeck; M. Jabłonka; E. Jaeschke; Kay Jensch; J.-P. Jensen; Steven L. Johnson; L. Juha; F. Kaerntner; R. Kammering; H. Kapitza; V. Katalev; B. Keil; S. Khodyachykh; Reinhard Kienberger; J.-W. Kim; Y. Kim; K. Klose; Vitali Kocharyan; Wolfgang Köehler; M. Koerfer; M. Kollewe; Qingyu Kong; W. Kook; D. Kostin; Oleg Kozlov; Daniel Kraemer; M. Krasilnikov; B. Krause; Olaf Krebs; J. Krzywiński; G. Kube; M. Kuhlmann; H. Laich; Ralph Lange; Mårten Larsson; R.W. Lee; A. Leuschner; H. Lierl; L. Lilje; T. Limberg; A. M. Lindenberg; D. Lipka; F. Loehl; Kai Ludwig; Hoang Mai Luong; C. Magne; A. Maquet; J. P. Marangos; C. Masciovecchio; M.A. Maslov; A. Matheisen; E. Matyushevskiy; O. Matzen; H.-J. May; Ian McNulty; Douglas McCormick; P v d Meulen; N. Meyners; P. Michelato; N. Mildner; V. Miltchev; M. Minty; W.-D. Moeller; T. Möller; Laura Monaco; M. Nagl; O. Napoly; Georg Neubauer; P. Nicolosi; Albert Nienhaus; D. Noelle; T. Núñez; F. Obier; A. Oppelt; C. Pagani; Rocco Paparella; H.B. Pedersen; B. Petersen; B. Petrosyan; L. Petrosyan; Alexander Yu. Petrov; J. Pflueger; P. Piot; Anton Plech; Elke Ploenjes; Luca Poletto; Gisela Pöplau; Eduard Prat; S. Prat; J. Prenting; D. Proch; D. Pugachov; H. Quack; B. Racky; D. Ramert; H. Redlin; K. Rehlich; R. Reininger; H. Remde; D. Reschke; Dieter Richter; M. Richter; S. Riemann; D. Riley; Ian Robinson; Jonas Malte Roensch; F. B. Rosmej; M. Ross; Joerg Rossbach; V. Rybnikov; M. Sachwitz; Evgeni Saldin; W. Sandner; Jens Schäfer; T. Schilcher; H. Schlarb; M. Schloesser; V. Schlott; B. Schmidt; M. Schmitz; Peter Schmueser; J.D. Schneider; E.A. Schneidmiller; Friedrich Schotte; S. Schrader; S. Schreiber; Christian G. Schroer; R. Schuch; H. Schulte‐Schrepping; A.S. Schwarz; M. Seidel; J. Sekutowicz; P. Seller; D. Sellmann; F. Senf; D. Sertore; A. Shabunov; Stefan Simrock; W. Singer; Harald Sinn; R. Smith; E. Sombrowski; A.A. Sorokin; Emma Springate; M. Staack; Lazar Staykov; B. Steffen; G. B. Stephenson; F. Stephan; F. Stulle; E. Syresin; K. P. Sytchev; V. Sytchev; G. J. Tallents; Simone Techert; N. Tesch; H. Thom; K. Tiedtke; M. Tischer; Metin Tolan; S. Toleikis; F. Toral; R. Treusch; D. Trines; V. Tsakanov; I. Tsakov; T. Tschentscher; F.-R. Ullrich; Ursula van Rienen; A. Variola; Ivan Vartaniants; Elmar Vogel; Julia K. Vogel; Rodolphe Vuilleumier; H. Wabnitz; Rainer Wanzenberg; J.S. Wark; Henning Weddig; T. Weiland; H. Weise; M. Wendt; R. Wenndorff; Romy Wichmann; I. Will; A. Winter; K. Witte; K. Wittenburg; P. Wochner; T. Wohlenberg; Jacek Wojtkiewicz; Alexander Wolf; Michaël Wulff; M.V. Yurkov; Igor Zagorodnov; P. Zambolin; K. Zapfe; P. Zeitoun; Volker Ziemann; A N Zolotov

doi:10.3204/desy_06-097

XFEL: The European X-Ray Free-Electron Laser - Technical Design Report

R. Abela, Arthur Aghababyan, M. Altarelli, C. Altucci, G. Amatuni, Philip Anfinrud, P. Audebert, V. Ayvazyan, N. Baboi, J. Baehr, V. Balandin, R. Bandelmann, Julian Becker, Bolko Beutner, C. Blome, I. Bohnet, Andy Bolzmann, Christoph Bostedt, Y. Bozhko, A. V. Brandt, S. Bratos, Christian Bressler, Ralf Brinkmann, Oleg Brovko, H. Brück, J.-P. Carneiro, S. Casalbuoni, M. Castellano, P. Castro, L. Catàni, A. Cavalleri, Serdar Çelik, Henry N. Chapman, D. Charalambidis, J. Chen, Majed Chergui, S. Choroba, A. Cianchi, M. Clausen, Éric Collet, H. Danared, C. David, Winfried Decking, M. Dehler, H. Delsim-Hashemi, G. Dipirro, B. R. Dobson, M. Dohlus, S. Duesterer, A. Eckhardt, H.-J. Eckoldt, H. Edwards, B. Faatz, M. Fajardo, Alexander Fateev, J. Feldhaus, Yu. F. Filipov, K. Floettmann, R. Follath, B. Fominykh, P. M. W. French, J. Frisch, L. Froehlich, E. Gadwinkel, L. García‐Tabarés, J.J. Gareta, T. Garvey, Faris Gel’mukhanov, U. Gensch, Ch. Gerth, M. Goerler, N. Golubeva, H. Graafsma, H.-J. Grabosch, W. Graeff, O. Grimm, B. Griogoryan, G. Grübel, Christian Gutt, Kirsten Hacker, L. Haenisch, U. Hahn, János Hajdu, J.H. Han, M. v. Hartrott, Jan Havlíček, O. Hensler, K. Honkavaara, V. Honkimäki, T. Hott, M.R. Howells, M. Huening, Hyotcherl Ihee, F.Ö. Ilday, R. Ischebeck, M. Jabłonka, E. Jaeschke, Kay Jensch, J.-P. Jensen, Steven L. Johnson, L. Juha, F. Kaerntner, R. Kammering, H. Kapitza, V. Katalev, B. Keil, S. Khodyachykh, Reinhard Kienberger, J.-W. Kim, Y. Kim, K. Klose, Vitali Kocharyan, Wolfgang Köehler, M. Koerfer, M. Kollewe, Qingyu Kong, W. Kook, D. Kostin, Oleg Kozlov, Daniel Kraemer, M. Krasilnikov, B. Krause, Olaf Krebs, J. Krzywiński, G. Kube, M. Kuhlmann, H. Laich, Ralph Lange, Mårten Larsson, R.W. Lee, A. Leuschner, H. Lierl, L. Lilje, T. Limberg, A. M. Lindenberg, D. Lipka, F. Loehl, Kai Ludwig, Hoang Mai Luong, C. Magne, A. Maquet, J. P. Marangos, C. Masciovecchio, M.A. Maslov, A. Matheisen, E. Matyushevskiy, O. Matzen, H.-J. May, Ian McNulty, Douglas McCormick, P v d Meulen, N. Meyners, P. Michelato, N. Mildner, V. Miltchev, M. Minty, W.-D. Moeller, T. Möller, Laura Monaco, M. Nagl, O. Napoly, Georg Neubauer, P. Nicolosi, Albert Nienhaus, D. Noelle, T. Núñez, F. Obier, A. Oppelt, C. Pagani, Rocco Paparella, H.B. Pedersen, B. Petersen, B. Petrosyan, L. Petrosyan, Alexander Yu. Petrov, J. Pflueger, P. Piot, Anton Plech, Elke Ploenjes, Luca Poletto, Gisela Pöplau, Eduard Prat, S. Prat, J. Prenting, D. Proch, D. Pugachov, H. Quack, B. Racky, D. Ramert, H. Redlin, K. Rehlich, R. Reininger, H. Remde, D. Reschke, Dieter Richter, M. Richter, S. Riemann, D. Riley, Ian Robinson, Jonas Malte Roensch, F. B. Rosmej, M. Ross, Joerg Rossbach, V. Rybnikov, M. Sachwitz, Evgeni Saldin, W. Sandner, Jens Schäfer, T. Schilcher, H. Schlarb, M. Schloesser, V. Schlott, B. Schmidt, M. Schmitz, Peter Schmueser, J.D. Schneider, E.A. Schneidmiller, Friedrich Schotte, S. Schrader, S. Schreiber, Christian G. Schroer, R. Schuch, H. Schulte‐Schrepping, A.S. Schwarz, M. Seidel, J. Sekutowicz, P. Seller, D. Sellmann, F. Senf, D. Sertore, A. Shabunov, Stefan Simrock, W. Singer, Harald Sinn, R. Smith, E. Sombrowski, A.A. Sorokin, Emma Springate, M. Staack, Lazar Staykov, B. Steffen, G. B. Stephenson, F. Stephan, F. Stulle, E. Syresin, K. P. Sytchev, V. Sytchev, G. J. Tallents, Simone Techert, N. Tesch, H. Thom, K. Tiedtke, M. Tischer, Metin Tolan, S. Toleikis, F. Toral, R. Treusch, D. Trines, V. Tsakanov, I. Tsakov, T. Tschentscher, F.-R. Ullrich, Ursula van Rienen, A. Variola, Ivan Vartaniants, Elmar Vogel, Julia K. Vogel, Rodolphe Vuilleumier, H. Wabnitz, Rainer Wanzenberg, J.S. Wark, Henning Weddig, T. Weiland, H. Weise, M. Wendt, R. Wenndorff, Romy Wichmann, I. Will, A. Winter, K. Witte, K. Wittenburg, P. Wochner, T. Wohlenberg, Jacek Wojtkiewicz, Alexander Wolf, Michaël Wulff, M.V. Yurkov, Igor Zagorodnov, P. Zambolin, K. Zapfe, P. Zeitoun, Volker Ziemann, A N Zolotov

DESY Publication Database (PUBDB) (Deutsches Elektronen-Synchrotron)

January 1, 2006

10.3204/desy_06-097

Cited by 347Open Access

Full Text

Abstract

The following topics are dealt with: TTF/FLASH in the XFEL context, general layout of the XFEL facility, the XFEL accelerator, undulators for SAES and spontaneous emission, photon beamlines and scientific instruments, infrastructure and auxiliary systems, commissioning and operation, project management and organization, cost and time schedule. (HSI)

Related Papers

No related papers found

Powered by citation graph analysis