Optimization of TiN/TaOx/HfO2/TiN RRAM Arrays for Improved Switching and Data Retention

Xueyao Huang(Institute of Microelectronics), He Qian(University of Science and Technology of China), Steve N. Nguyen(Rambus (United States)), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Deepak Sekar(Rambus (United States)), Kun Wang(Zhejiang University)
Unknown
May 1, 2015
10.1109/imw.2015.7150300
Cited by 24

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