Reliability significant improvement of resistive switching memory by dynamic self-adaptive write method
Yali Song(Shandong University), Jian-Yi Wu(Semiconductor Manufacturing International (China)), Yujia Liu(Fudan University), Qingtian Zou(The University of Texas Southwestern Medical Center), Fei Xiao(Huazhong University of Science and Technology), Ru Huang(Hunan Xiangdian Test Research Institute (China)), Ying Shirley Meng(Xihua University), Bin Chen(Zunyi Medical University), Yuanhai Lin(Fudan University), Xiaoyong Xue(Beijing University of Chinese Medicine)
Symposium on VLSI Technology
June 11, 2013
Cited by 21
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