RF performance degradation in nMOS transistors due to hot carrier effectsJong‐Tae Park, Hyun-Kyu Yu, Byung-Jin Lee et al.|IEEE Transactions on Electron Devices|2000Cited by 80
CCDC 1900326: Experimental Crystal Structure DeterminationJinwoo Kim, Sukbok Chang, Seongho Jin et al.|The Cambridge Structural Database|2019Cited by 0